Automatic Probe Arm Changing Device TWE

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Automatic Probe Arm Changing Device TWE
  • Mã SP: CB0MA- FBV
  • Giá NY: Liên hệ
  • Giá bán: Liên hệ
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  • Technological advancement allows an increasingly higher quality of components along with the trend towards smaller dimensions of workpieces.

    The quality of contour and surface play an increasingly important role.
    The demand for automated testing close to the production site continues.
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Technological advancement allows an increasingly higher quality of components along with the trend towards smaller dimensions of workpieces.

The quality of contour and surface play an increasingly important role.
The demand for automated testing close to the production site continues.

Workpieces with sometimes 35 and more measuring points require measuring systems which can be changed with diverse probe elements in an automated process.

The measuring system described here offers resolution in the nm range for contour and roughness depth–measurement and evaluation in one step.

The probe arm change takes place completely automatically. The surface contour measuring station XP 20 CNC, model 5, shown here with automatic probe arm changing unit, can measure workpieces
with a measuring volume of 120 mm x 120 mm x 120 mm (4.72 in × 4.72 in × 4.72 in ×).


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