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Đồng hồ đo độ dày 7321 Mitutoyo
- Phạm vi đo : 0-10mm
- Độ chia : 0.01mm
- Xuất xứ : Nhật

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Đồng hồ đo độ dày 7301 Mitutoyo

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FISCHER offers the following accessories for X-RAY Measuring systems:

Press tool for chips, e.g. for pressing gold chips
Measuring cells for solution analysis
Several sample support plates, e.g. with radiation traps
Vices for sample fixing

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The traceability of FISCHER calibration standards works according to the following principle.

We comply with the accreditation procedure of the German accreditation service („Deutscher Akkreditierungsservice: DKD/DAkkS“) , please see our accreditation document. This procedure is applicable for many pure-element-coatings. Our own DKD/DAkkS-calibration lab secures the traceability on internationally accredited material measures. Since July 2003, the Helmut Fischer GmbH has, as the first company in Germany, a calibration lab for the measurement quantity ”mass per unit area” certified according to DIN EN ISO/IEC 17025. This certification entitles Fischer to issue DKD/DAKKS calibration certificates for mass per unit area calibration standards that are used to calibrate X-ray fluorescence instruments for coating thickness measurement

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Features

Universal, only one software for all X-RAY measuring systems
Coating thickness measurement and analysis
One single package with all functions
User-friendly, intuitive operation
Fundamental parameter method
Sorting by class of materials
Automated measurement sequences
Adjustable measuring parameters (high voltage, filters and apertures)

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Features

Flange measuring head for continuous measurements in production lines
Proportional counter tube, peltier-cooled silicon PIN diode or silicon drift detector as X-ray detector
Quick and easy calibration on a workpiece master directly in the production process
For use in air or vacuum

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Features

For continuous measurement of coatings on foils, strips and punched strips in ongoing production
Measuring head may be positioned at right angles to the transport direction of the specimen
Easy handling and quick start-up
Proportional counter tube, peltier-cooled silicon PIN diode or silicon drift detector as X-ray detector
Positioning device for measurements on several measuring positions

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Features

Universal premium instrument with comprehensive measurement capabilities
Outfitted with a measurement chamber that can be evacuated, making it possible to analyse light elements beginning at Z=11 (Na)
Automated series testing with precise, programmable XYZ-stage
Video camera for exact sample positioning and for measuring small sections

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Features

Measuring instrument optimised for micro-analysis
Depending on the X-ray optics, structures with a size of
100 μm or less can be analysed
Very high intensities and thus good precision
Even for thin coatings, measurement uncertainty < 1 nm possible
Suitable only for plane or nearly plane samples
Large and spacious measurement chamber with a cutout
(C-slot)
Automated series testing with fast, programmable XY-stage

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Features

Premium model with universal application characteristics
Highest excitation flexibility, for both the size of the measurement spot and the spectral composition
With the silicon drift detector, even very high intensities
> 100 kcps can be processed without a loss in energy resolution
Very low detection limits and excellent repeatability
Large and easily accessible measurement chamber
Automated series testing with fast, programmable XY-stage

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Features

With semiconductor detector, this expands the possibilities in element analyses and for measuring thin coatings – due to better signal/noise ratios
Micro-focus tube allows also for smaller measurement spots, but because lower in intensity, less well suited for smaller structures.
Large and spacious measurement chamber with a cutout
(C-slot)
Fast, programmable XY-stage with pop-out function

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Features

Very universal because equipped with a micro-focus tube, 4-x aperture changer and 3 primary filters
Suitable for smaller structures such as connector contacts or printed circuit boards
Larger measuring distances are possible as well (DCM, stroke 0-80 mm)
Large and spacious measurement chamber with a cutout
(C-slot)
A programmable stage for automated measurements is available

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Features

Robust instrument suited for coating thickness measurements, even at large measuring distances (DCM, stroke 0-80 mm)
Features a fixed aperture and a fixed filter
Suitable for structure sizes starting at about 1 mm
Large and spacious measurement chamber with a cutout
(C-slot)
A programmable stage for automated measurements is available
Standard X-ray tube, proportional counter tube

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Features

Analysis instrument that measures from bottom to top, Very flexible in its use
Fully enclosed measurement chamber allows also for large apertures and thus for high count rates
Measuring direction from bottom to top, this allows for quick and easy sample positioning
Highest excitation flexibility, for both the size of the measurement spot and the spectral composition
With the silicon drift detector, even very high intensities
> 100 kcps can be processed without a loss in energy resolution
Ideal for the analysis of gold alloys and for trace analysis of harmful substances in plastics

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Features

Specialised for the cost-effective analysis of gold alloys
Fixed aperture and fixed filter; thus particularly suited for precious metal analysis
With semiconductor detector also applicable for more complex analyses with many elements
Measuring direction from bottom to top, this allows for quick and easy sample positioning

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Features

Flexible instrument for measuring coating thickness with multiple uses
Both thin and thick coatings (e.g. 50 nm Au or 100 μm Sn) can be measured equally well through selectable high voltage filter combinations
The micro-focus tube enables small measurement spot sizes at short measurement distances of just 100 μm
High count rates of a few kcps through proportional counter tube
Measuring direction from bottom to top, this allows for quick and easy sample positioning
Large measurement chamber with a cutout (C-slot)

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Features

For coating thickness measurements in the electroplating industry
Fixed aperture and fixed primary filter
X-ray tube with a slightly larger primary spot, well suited for applications with measurement spot sizes starting at
about 1 mm
Low-energy beam components are excited with lower effectiveness, however for standard applications measuring the thickness of typical electroplated coatings such as Cr, Ni, Cu, this poses little to no problem
Measuring direction from bottom to top, this allows for quick and easy sample positioning
Large measurement chamber with a cutout (C-slot)
Standard X-ray tube, proportional counter tube

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Features

Utilizes the coulometric method according to DIN EN ISO 2177 and 50022 standard and ASTM B764.
With this instrument, the electrochemical potential differences between the nickel coatings can be measured easily. It also measures the thicknesses of copper carrier coatings, nickel multi-coatings and chrome coatings.