FISCHERSCOPE® X-RAY XDV®-µ

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FISCHERSCOPE® X-RAY XDV®-µ
  • Mã SP: CAFHFC-F-XRAY XDV-Μ
  • Giá NY: Liên hệ
  • Giá bán: Liên hệ
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  • Features

    Measuring instrument optimised for micro-analysis
    Depending on the X-ray optics, structures with a size of
    100 μm or less can be analysed
    Very high intensities and thus good precision
    Even for thin coatings, measurement uncertainty < 1 nm possible
    Suitable only for plane or nearly plane samples
    Large and spacious measurement chamber with a cutout
    (C-slot)
    Automated series testing with fast, programmable XY-stage
  • Tags: Bàn Map
Đơn vị tiền tệ
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  • Thành tiền

Features

  • Measuring instrument optimised for micro-analysis
  • Depending on the X-ray optics, structures with a size of
    100 μm or less can be analysed
  • Very high intensities and thus good precision
  • Even for thin coatings, measurement uncertainty < 1 nm possible
  • Suitable only for plane or nearly plane samples
  • Large and spacious measurement chamber with a cutout
    (C-slot)
  • Automated series testing with fast, programmable XY-stage 

Typical fields of application

  • Measurement of coating systems on PC Boards, leadframes and wafers
  • Measurement of coating systems on small components and thin wires
  • Materials analysis on small structures and small components


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