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Features

Universal premium instrument with comprehensive measurement capabilities
Outfitted with a measurement chamber that can be evacuated, making it possible to analyse light elements beginning at Z=11 (Na)
Automated series testing with precise, programmable XYZ-stage
Video camera for exact sample positioning and for measuring small sections

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Measuring instrument optimised for micro-analysis
Depending on the X-ray optics, structures with a size of
100 μm or less can be analysed
Very high intensities and thus good precision
Even for thin coatings, measurement uncertainty < 1 nm possible
Suitable only for plane or nearly plane samples
Large and spacious measurement chamber with a cutout
(C-slot)
Automated series testing with fast, programmable XY-stage

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Features

Premium model with universal application characteristics
Highest excitation flexibility, for both the size of the measurement spot and the spectral composition
With the silicon drift detector, even very high intensities
> 100 kcps can be processed without a loss in energy resolution
Very low detection limits and excellent repeatability
Large and easily accessible measurement chamber
Automated series testing with fast, programmable XY-stage

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With semiconductor detector, this expands the possibilities in element analyses and for measuring thin coatings – due to better signal/noise ratios
Micro-focus tube allows also for smaller measurement spots, but because lower in intensity, less well suited for smaller structures.
Large and spacious measurement chamber with a cutout
(C-slot)
Fast, programmable XY-stage with pop-out function

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Very universal because equipped with a micro-focus tube, 4-x aperture changer and 3 primary filters
Suitable for smaller structures such as connector contacts or printed circuit boards
Larger measuring distances are possible as well (DCM, stroke 0-80 mm)
Large and spacious measurement chamber with a cutout
(C-slot)
A programmable stage for automated measurements is available

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Robust instrument suited for coating thickness measurements, even at large measuring distances (DCM, stroke 0-80 mm)
Features a fixed aperture and a fixed filter
Suitable for structure sizes starting at about 1 mm
Large and spacious measurement chamber with a cutout
(C-slot)
A programmable stage for automated measurements is available
Standard X-ray tube, proportional counter tube

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Analysis instrument that measures from bottom to top, Very flexible in its use
Fully enclosed measurement chamber allows also for large apertures and thus for high count rates
Measuring direction from bottom to top, this allows for quick and easy sample positioning
Highest excitation flexibility, for both the size of the measurement spot and the spectral composition
With the silicon drift detector, even very high intensities
> 100 kcps can be processed without a loss in energy resolution
Ideal for the analysis of gold alloys and for trace analysis of harmful substances in plastics

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Specialised for the cost-effective analysis of gold alloys
Fixed aperture and fixed filter; thus particularly suited for precious metal analysis
With semiconductor detector also applicable for more complex analyses with many elements
Measuring direction from bottom to top, this allows for quick and easy sample positioning

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Flexible instrument for measuring coating thickness with multiple uses
Both thin and thick coatings (e.g. 50 nm Au or 100 μm Sn) can be measured equally well through selectable high voltage filter combinations
The micro-focus tube enables small measurement spot sizes at short measurement distances of just 100 μm
High count rates of a few kcps through proportional counter tube
Measuring direction from bottom to top, this allows for quick and easy sample positioning
Large measurement chamber with a cutout (C-slot)

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For coating thickness measurements in the electroplating industry
Fixed aperture and fixed primary filter
X-ray tube with a slightly larger primary spot, well suited for applications with measurement spot sizes starting at
about 1 mm
Low-energy beam components are excited with lower effectiveness, however for standard applications measuring the thickness of typical electroplated coatings such as Cr, Ni, Cu, this poses little to no problem
Measuring direction from bottom to top, this allows for quick and easy sample positioning
Large measurement chamber with a cutout (C-slot)
Standard X-ray tube, proportional counter tube

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Utilizes the coulometric method according to DIN EN ISO 2177 and 50022 standard and ASTM B764.
With this instrument, the electrochemical potential differences between the nickel coatings can be measured easily. It also measures the thicknesses of copper carrier coatings, nickel multi-coatings and chrome coatings.

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Coulometric method acc. to standard DIN EN ISO 2177 by deplating the coating
Automatic filling and emptying of the measuring cell by pump control with V18 stand
Large graphical LCD supports operation and coating results

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The SR-SCOPE® measures the thickness of copper coatings on the top side of pc-boards according to the standard EN 14571 with the microresistivity method.

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This plug-in testing module BETASCOPE® within the MMS-series utilizes the beta backscattering method.
It allows the thickness measurement of coatings consisting of practically any material on any substrate under the condition that there is a difference of at least 5 atomic numbers between coating and substrate materials.

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Calibration standards

Coating thickness standards, e.g. foils
Ferrite standards
Conductivity standards
many of them with factory calibration certificate, (on request)

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Coating thickness measurement and material testing with just one instrument!
Compact and extremely versatile desktop multi-function measuring system with data archiving and measurement data processing capabilities.
Six plug-in testing modules allow numerous instrument configurations to meet the needs of the user. The modular design allows the upgrading of the instrument for further measurement methods at a later time.

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Coating thickness measurement and material testing with just one instrument!
Compact and extremely versatile desktop multi-function measuring system with data archiving and measurement data processing capabilities.
User-friendly operation with large, high-resolution color LCD touch screen. Windows CE® based.
Many different plug-in testing modules allow numerous instrument configurations to meet the needs of the user. The modular design allows the upgrading of the instrument at any time. Similar or different modules can be installed depending on the applications.

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FISCHER probes are extremely robust and wear-resistant – they deliver precise measurements over a long period of time even on hard surfaces and after millions of uses.
All probes are developed and manufactured in-house to strict quality standards.
Each individual probe is factory calibrated at several reference points with the greatest care to ensure the highest possible degree of trueness