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Measuring range: 350 µm/180 µm/90 µm (changes automatically)
Pick-up: Inductive skidded pick-up, 2 μm (80 μin) stylus tip, measuring force approx. 0.7 mN
Unit of measurement: Metric, inch
standards: DIN/ISO/JIS/ASME
Traversing length Lt* 1.75 mm, 5.6 mm, 17.5 mm; automatic (0.069 in, 0.22 in, 0.69 in)
Traversing length (acc. to MOTIF): 1 mm, 2 mm, 4 mm, 8 mm, 12 mm, 16 mm (0.040 in,
0.080 in, 0.160 in, 0.320 in, 0.480 in, 0.640 in)

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Measuring range of up to 350 μm (.014 in)
Units μm/μinch selectable
Standards: ISO/ASME/JIS and MOTIF selectable
Travsersing length as per DIN EN ISO 4288/ ASME B46.1:
1.75 mm, 5.6 mm, 17.5 mm (0.07 in, 0.22 in, 0.7 in)
as per EN ISO 12085: 1 mm, 2 mm, 4 mm, 8 mm, 12 mm, 16 mm
Number of sampling lengths selectable from 1 to 5
Automatic selection of filter and traversing length conforming to standards
Phase-correct profile filter as per DIN EN ISO 11562
Cutoff 0,25 mm 0,80 mm 2,50 mm
(0.010 in 0.032 in 0.100 in)

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Measuring range up to 350 μm (0.014 in)
Selectable unit of measure μm/μinch
Standards: ISO/ASME/JIS and MOTIF selectable
Tracing lengths as per DIN EN ISO 4288/ ASME B46.1: 1.75 mm, 5.6 mm, 17.5 mm
(0.07 in, 0.22 in, 0.7 in)
as per EN ISO 12085: 1 mm, 2 mm, 4 mm, 8 mm, 12 mm, 16 mm

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- Motherboard Pentium with 32 Mbytes RAM
- Hard disk drive with a minimum capacity of 2 GB including controller
- Integrated disk drive, 3.5", with a capacity of 1.44 Mbytes
- Integrated high-resolution 12" TFT color display (graphic representations
possible) including interface
4 internal measuring inputs with 12 bit resolution for connection
to inductive probe integrated at the rear

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- Motherboard Pentium with 32 Mbytes RAM
- Battery-buffered real-time clock
- Hard disk drive with a minimum capacity of 2 GB including controller
- Integrated disk drive, 3.5", with a capacity of 1.44 Mbytes
- Integrated high-resolution 12" color monitor (graphic representations possible) including monitor interface

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Compact multi gaging measuring computer with color LCD. 12 input channels for probes.

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The software for roughness measurement is characterized in the basic version by the following characteristics:

• Over 80 parameters selectable for R, P, W profile as per current standards ISO/JIS or MOTIF (ISO 12085)
• Band-pass filter Ls according to current standard, LS can also be switched off or freely varied
• Comprehensive recording records
• Quick and Easy measuring programs can be quickly created in the teach-in procedure
• Automatic function for the standardized selection of cutoff and probe length (patented)
• Support of different calibration methods (static and dynamic) with specificaiton of the parameter Ra or Rz
• Maintenance and calibration intervals can set

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Measuring and evaluating geometries of workpieces and tools that are relevant for correct functioning is one of the primary requirements of research, technology and industry. The tried-and-tested, user-friendly MarSurf XC 2 is the best example of this. Not only does it meet all requirements in terms of accuracy and different evaluation criteria, it also delivers reliable results time after time.

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MarSurf XC 20 is the top contour system of Mahr. The system offers with the optimal measuring equipment the highest measuring performance. MarSurf XC 20 controlls the drive units PCV as well as the measuring stand ST 500 or ST 750.

The MarSurf measuring stations combine outstanding instruments with patented ideas.

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The new generation of combined roughness and contour measurement systems. The MarSurf XCR 20 is ideal for combining contour and roughness depth evaluation. The roughness software and contour software each have their own user interface. MarSurf XCR 20 is Mahr's top surface measurement system and enables even semi-automated operating sequences such as measuring stand positioning (ST 750 CNC) to be performed with ease.

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High measuring and positioning speed
Long measuring length, karge measuring stroke
Groundbreaking oribe system with bionic probe design
Probe arms with magnetic holder and probe arm recognition

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Roughness and contour in a single stroke You need only half the time and your work is faster, more reliable and more efficient.With just one measurement, you have all the results for
roughness and contour characteristics at a glance. So you have
more time for other things!

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Metrology becomes more and more an integrated part in the manufacturing line. Process supervision in or at least close to the production is very important to detect and correct soonest possible deviation trends or at the worst stop manufacturing.

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There is an increasing trend towards automated surface and contour measuring.

Positioning the probe system to the measuring point on small workpieces usually takes place by moving or turning the workpiece.

For larger or longer and heavier components, it is more advantageous to move the measuring element to the measuring point of the workpiece and not the other way around.

The measuring station "XP 20 V2 CNC, Model 6" described here provides the solution to your surface and contour measurement tasks on shafts.
Especially camshafts and crankshafts can be measured up to a length of 800 mm (31.5 in) and a diameter of 300 mm (11.8 in).

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An increasingly more compact and favorable system design is demanded on optical systems such as zoom lenses, optics for DVD drives and lenses in the cameras of mobile phones, for example.

For this purpose, in addition to classic, spherical lense shapes (sphere-shaped), the optics industry is increasingly producing aspheric shaped (not sphere-shaped) lenses.

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Technological advancement allows an increasingly higher quality of components along with the trend towards smaller dimensions of workpieces.

The quality of contour and surface play an increasingly important role.
The demand for automated testing close to the production site continues.

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10% Giá trị đơn hàng

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